The GI30 adds enhanced imaging & analysis with surface mapping,data acquisition and colour display 
Key Features
- High precision flatness measurement of ground, lapped and semi-polished samples
- 3 dimensional imaging & analysis capacity
- Measure 2µm per fringe with excellent clarity
- Measure surfaces with roughness from 1nm to 300nm Ra
Description
Surface flatness measurement is essential to any laboratory or workshop concerned with the manufacture of precision flat components. As a result of work in both customer training and in new product / process development, we are continually called upon to make flatness measurements on the materials we process.
The ability to measure the surface flatness of ground, lapped or semi-polished surfaces is an essential requirement and this led to the development of this unit. The GI20 Unit is a high precision Grazing Incidence Interferometer.
It projects laser light at an angle which is almost horizontal to the surface of the sample under test, greatly enhancing the reflectance of the test surface and enabling the measurement of non-optical surfaces.
It allows rapid and easy measurements to be made "in process" and displays the interferogram on a 7" diagonal black-and-white CRT screen. Fringe spacing is a fixed 2 microns, producing excellent contrast levels with surface finishes from 1nm to 300nm Ra.
Applications
Applications for flatness measurement systems are virtually limitless. Whether the requirement is for flatness measurement or quality assessment, Logitech grazing incidence interferometers provide an excellent solution when processing :
- Semiconductor wafers
- Optical components
- Machined components
- Geological samples
The GI20 is particularly useful where a level of automation is required to help speed up the quality assessment process.
Product Options
The GI20 is available in either 240V, 50-60Hz or 110V,50-60Hz and is available with the following additional accessories:
- Test Flat
- Video Capture Unit
Product Specification
| Power Supply : | 240V, 50/60Hz 110V, 50/60Hz |
| Max Sample Size : | 150mm (6")ø |
| Surface Roughness : | 1nm to 300nm Ra |
| Fringe Spacing : | 2µm |
| Height : | 260mm |
| Depth : | 602mm |
| Width : | 430mm |
| Net Weight : | 24Kg |
For more information on the GI20 Flantess Measurement System, call us on +44 (0)1389 875444 or complete our contact form.