对加工完的工件进行检查和装配前的准备工作非常关键，Logitech的光学检验和测量设备正是为此目的设计。
Logitech的检验和测量设备应用的范围包括：
- 厚度测量
- 平整度测量
- 角度测量
CG-10 Gauge
The Logitech CG-10 Precision Electronic Measurement Systems is a compact gauging instrument suitable for most linear dimensional measurement applications.
GI-20 Flatness Measurement Gauge
The ability to measure the surface flatness of ground, lapped or semi-polished surfaces is a major benefit of the GI20 Unit.
LI-15 Fizeau Interferometer
The LI15 is ideal for checking optical flats and for carrying out flatness measurements on a wide range of optical components. It can also be used for measuring the flatness of polished semiconductor materials, where flatness is essential for subsequent processing.
NCG-2 Non-Contact Thickness Measurement Gauge
The NCG-2 is ideal for production and research environments in semiconductor, optics and electro-optics application areas, where the requirement is to measure precisely polished or fragile materials.
LG-1 Autocollimator
Autocollimators are used in laboratories to measure angles, typically small angular variations between two near-parallel surfaces. In polishing, the LG1 is typically used to adjust the orientation of a wafer or plate so that the front face is lapped and polished parallel to a reference face.
GI30 Flatness Measurement System
The GI30 is a grazing incidence interferometer that provides high precision flatness measurement suitable for use with lapped and semi-polished surfaces up to 150mm (6")ø.
LI-10 Fizeau Interferometer
The LI10 is ideal for checking optical flats and for carrying out flatness measurements on a wide range of optical components. It can also be used for measuring the flatness of polished semiconductor materials, where flatness is essential for subsequent processing.
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