Key Features
- High precision flatness measurement of polished samples to lambda/10
- 3 dimensional imaging & analysis capacity
- Measure 0.335µm per fringe with high clarity
- Image & analyse fringe patterns on materials from 1" to 6"ø
Description
The Logitech LI15 is a multiple beam Fizeau interferometer ideally suited to a wide range of flatness measurement operations on specimens up to 102mm (4") diameter in both optical component production and research and development laboratories.
Our fizeau interferometer offers a rapid and accurate method for the optical measurement of surface flatness and has the distinct advantage of non-contact between the reference flat, which has a flatness of l/20, and the surface under test.
Each LI15 fizeau interferometer offers a rapid and accurate method for the optical measurement of polished surface flatness. The reference flat has a flatness of lambda/10 and does not come into contact with the surface under test. This allows a contour map, or interferogram, to be produced by the interference of reflections between these two surfaces. In the LI15 fizeau interferometer, this image is displayed as a black and white interferogram on the 7" diagonal black and white CRT screen positioned on the front of the unit.
Analysis software is then used to produce a 3-dimensional graphic of the sample surface (PC and software supplied). Each interferometer is fitted with an internal camera to provide the specially designed software with the images necessary to build a 3-dimensional map of the sample surface. The LI15 software package has a complete set of publication quality graphics features including perspective plots, colour contour maps, and cross sectional plots. Using the Logitech LI15 fizeau interferometer automatically show whether the sample surface is convex or concave. Real-time interactive features (shown below) include translation, rotation, scaling, zooming and cross-section displays.
The LI15 is also available with a number of different viewing options, including CCTV and wide angle telescope.
Fizeau Interferometer Applications
The Logitech LI15 Fizeau Interferometer is ideal for checking optical flats and for carrying out flatness measurements on a wide range of optical components. It can be used for measuring the flatness of polished semiconductor or optical materials, where flatness is essential for subsequent processing. The LI15 fizeau interferometer is particularly useful where a level of data acquisition and recording is required to help speed up the quality assessment process.
Product Options
The LI15 fizeau intermerometer is available in either 220V, 50Hz or 110V,50Hz and is available with the following additional accessories :
- Vacuum Chuck
- Wide Angle Telescope
- Binocular Viewer
- CCTV 220V/50Hz
Product Specification
| Power Supply : | 240V, 50Hz 110V, 50Hz |
| Max Sample Size : | 102mm (4")ø (5"/6" on other models) |
| Aperature : | 102mm (4")ø (5"/6" on other models) |
| Refernce Flat : | Flatness  /10Parallelism 20 +/- 5 min of arc min. positive wedge |
| Fringe Spacing : | 0.316µm |
| Illumination : | 0.5mw HeNe Laser |
| Height : | 346mm |
| Depth : | 610mm |
| Width : | 430mm |
| Net Weight : | 28Kg |
For more information on the LI15 Fizeau Interferometer, call us on +44 (0)1389 875444 or complete our contact form.